In-situ characterization of the optical and electronic properties in GeTe and GaSb thin films

Publication type: 
Journal
Autori: 
Velea, A; Socol, G; Popescu, M; Galca, AC
Anul: 
2015
DOI: 
http://dx.doi.org/10.1063/1.4932666

Journal data

Journal: 
JOURNAL OF APPLIED PHYSICS
Vol.: 
118
Pag.: 
135712