Study of the charge transport mechanism in pulsed laser deposited AlN:Si films

Publication type: 
Journal
Autori: 
Minkov, IP; Simeonov, S; Szekeres, A; Cziraki, A; Socol, G; Ristoscu, C; Mihailescu, IN
Anul: 
2012
DOI: 
http://dx.doi.org/10.1088/1742-6596/356/1/012038

Journal data

Journal: 
17TH INTERNATIONAL SUMMER SCHOOL ON VACUUM, ELECTRON, AND ION TECHNOLOGIES (VEIT 2011)
Vol.: 
356
Pag.: 
12038