Interface characterization and atomic intermixing processes in Be/W bilayers deposited on Si(001) substrates with Fe buffer layers

Publication type: 
Journal
Autori: 
Kuncser, V; Palade, P; Schinteie, G; Sandu, SG; Trupina, L; Lungu, GA; Gheorghe, NG; Teodorescu, CM; Porosnicu, C; Jepu, I; Lungu, CP; Filoti, G
Anul: 
2012
DOI: 
http://dx.doi.org/10.1016/j.jallcom.2011.09.063

Journal data

Journal: 
JOURNAL OF ALLOYS AND COMPOUNDS
Vol.: 
512
Pag.: 
199 206