Preliminary ellipsometric studies and tests for measuring the birefringence of electro-optic materials

Publication type: 
Journal
Autori: 
Logofatu, PC; Udrea, C; Ion, V; Scarisoreanu, ND; Muller, R
Anul: 
2010
DOI: 
http://dx.doi.org/10.1117/12.882140

Journal data

Journal: 
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES V
Vol.: 
7821
Pag.: 
782114