2010

Investigations of microstructural evolutions after rapid thermal annealing of phosphorus doped ZnO films grown by pulsed laser deposition

Authors: 
Jang, JH; Kim, HS; Norton, DP; Craciun, V
Year: 
2010

Effect of incident laser fluence on the structure of pulsed-laser deposited AlN films

Authors: 
Szekeres, A; Simeonov, S; Bakalova, S; Minkov, I; Cziraki, A; Ristoscu, C; Socol, G; Dorcioman, G; Mihailescu, IN
Year: 
2010

Structure and tribological properties of carbon based nanocomposites grown by TVA method

Authors: 
Vladoiu, R; Ciupina, V; Contulov, M; Mandes, A; Dinca, V; Prodan, G; Lungu, CP
Year: 
2010

Mn-12 benzoate thin films on Si substrates fabricated by matrix assisted pulsed laser evaporation

Authors: 
Pervolaraki, M; Athanasopoulos, GI; Giapintzakis, J; Kizas, C; Tasiopoulos, AJ; Sima, F; Socol, G; Mihailescu, IN
Year: 
2010

Development of Fe-doped SnO2-based nanocomposites prepared by single-step laser pyrolysis

Authors: 
Alexandrescu, R; Morjan, I; Dumitrache, F; Birjega, R; Fleaca, C; Luculescu, CR; Popovici, E; Soare, I; Sandu, I; Dutu, E; Prodan, G
Year: 
2010

Modifications of the Catalytic Activity for Cyanoethylation Induced by the Memory Effect of Mg/Al-Type Modified Hydrotalcites

Authors: 
Pavel, OD; Birjega, R; Angelescu, E; Zavoianu, R; Florea, M; Mitran, G
Year: 
2010

Zirconium carbonitride films deposited by combined magnetron sputtering and ion implantation (CMSII)

Authors: 
Grigore, E; Ruset, C; Li, X; Dong, H
Year: 
2010
DOI: 
http://dx.doi.org/10.1016/j.surfcoat.2009.11.012

The influence of carbon content on the characteristics of V-C-N coatings deposited by combined magnetron sputtering and ion implantation (CMSII)

Authors: 
Grigore, E; Ruset, C; Li, X; Dong, H
Year: 
2010
DOI: 
http://dx.doi.org/10.1016/j.surfcoat.2009.11.029

Characteristics of (TiAlCrNbY)C films deposited by reactive magnetron sputtering

Authors: 
Braic, M; Braic, V; Balaceanu, M; Zoita, CN; Vladescu, A; Grigore, E
Year: 
2010
DOI: 
http://dx.doi.org/10.1016/j.surfcoat.2009.10.049

Specificity of defects induced in silicon by RF-plasma hydrogenation

Authors: 
Ghica, C; Nistor, LC; Stefan, M; Ghica, D; Mironov, B; Vizireanu, S; Moldovan, A; Dinescu, M
Year: 
2010
DOI: 
http://dx.doi.org/10.1007/s00339-009-5527-1
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