Structural and electrical properties of N doped SiC nanostructures obtained by TVA method

Ciupina, V; Lungu, CP; Vladoiu, R; Prodan, GC; Antohe, S; Porosnicu, C; Stanescu, I; Jepu, I; Iftimie, S; Belc, M; Mandes, A; Dinca, V; Vasile, E; Zarovski, V; Nicolescu, V; Caraiane, A